Ultrasonic Flaw Detector (PXUT-330N)

2025-08-21

Functions & Features

Calendar and clock: The instrument automatically records the working date and time.

20 independent ultrasonic testing channels (expandable). Multiple testing procedures and standards are automatically generated. Industry-specific testing standards can be freely configured, eliminating the need for test blocks during on-site inspection.

TFT true-color display with clear screen brightness, adaptable to various operating environments. Multiple colors are adjustable for personalized operation design.

Unique backlit keypad design to meet the requirements of different testing environments.

Real-time display of defect echo parameters (distance, vertical, horizontal, amplitude, dB or equivalent aperture value); actual depth of defects detected by multiple echoes can be directly displayed.

DAC and AVG curves are automatically generated with unlimited sampling points, and can be compensated and corrected. DAC curves automatically float with gain, expand with sound path, and shift with delay; distance-amplitude compensation for specified echoes is supported. AVG curves for any aperture can be displayed. The instrument automatically reads the amplitude dB value after DAC curve creation.

Reading and alarm for initial gate and loss gate; gate position, gate width and gate height are freely adjustable.

Unique adjustable gain, sound path and gate via direct input, enabling fast and accurate flaw detection.

Equipped with peak memory, echo envelope, in-gate alarm, curved surface correction, in-gate expansion, DAC gate, depth compensation, solid waveform display, waveform freeze, weld diagram display, etc. Supports intelligent evaluation in accordance with GB/T 11345-2013.

Profile display for more intuitive detection results.

Adjustable pulse width, transmitting voltage, filter band and probe damping, suitable for accurate testing of various workpieces.

Automatic height measurement of defect cracks using end-point diffraction waves.

Probe spectrum analysis function for real-time monitoring of probe performance parameters.

Powerful data processing: data can be retrieved and processed by date, storage number and serial number; data protection, high-speed data interface and fast report printing are supported.

SD card storage for real-time continuous recording of dynamic waveforms. Adopts international standard USB interface and VGA interface for connecting external projectors and monitors, convenient for training and teaching.

Technical Parameters

● Frequency Band: 0.4 – 20 MHz

● Sampling Frequency: 160 MHz (real-time hardware sampling)

● Gain Range: 120 dB, steps of 0.1, 1.0, 2.0, 6.0 dB

● Measuring Range: 0 – 10000 mm (longitudinal wave in steel)

● Dynamic Range: ≥ 40 dB

● Vertical Linearity: ≤ 2%

● Horizontal Linearity: ≤ 0.1%

● Resolution: ≥ 32 dB

● Sensibility Reserve: ≥ 65 dB (200 mm – Φ2 flat-bottom hole, 2.5PΦ20)

● Attenuation Accuracy: < ±1 dB / 20 dB

● Probe Mode: Single crystal, dual crystal, through-transmission

● Display: 5.7" TFT LCD, 640×480

● Power Supply: 16V DC; 220V AC high-performance lithium battery

● Operating Temperature: -20 ~ 50 ℃

● Operating Time: ≥ 8 hours (lithium battery powered)

● Dimensions (LWT): 246 mm × 156 mm × 45 mm

● Net Weight: 1.15 Kg (including lithium battery)